@Article{SilvaNetoRossBarr:2014:ChMuFe,
               author = "Silva Neto, Lauro Paulo da and Rossi, Jos{\'e} Osvaldo and 
                         Barroso, Joaquim Jos{\'e}",
          affiliation = "{Instituto Nacional de Pesquisas Espaciais (INPE)} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)} and {Instituto Nacional de 
                         Pesquisas Espaciais (INPE)}",
                title = "Characterization of multilayer ferroelectric ceramic capacitors in 
                         a wide frequency range for RF applications",
              journal = "Advanced Materials Research",
                 year = "2014",
               volume = "975",
                pages = "61--66",
             keywords = "Barium titanate, Ceramic materials, Characterization, Electric 
                         impedance, Multilayers, Natural frequencies, Polychlorinated 
                         biphenyls, X ray spectroscopy, Chemical compositions, Dielectric 
                         characterization, Loss tangent, Microwave electronics, Multi-layer 
                         ceramic capacitor, Multilayer ceramic capacitors, Parasitic 
                         inductances, Printed circuit board (PCBs), Ceramic capacitors.",
             abstract = "Surface mount devices (SMDs) such as multilayer ceramic capacitors 
                         (MLCCs) have been widely used to reduce the size of electronic 
                         circuits as they are mounted directly onto the surface of printed 
                         circuit boards (PCBs) and are smaller than their through-hole 
                         counterparts because SMDs have shorter internal leads or no leads 
                         at all. Another advantage of these components is the lower 
                         parasitic inductance, which results in a higher resonant 
                         frequency. This work reports on the dielectric characterization of 
                         four commercial multilayer ceramic capacitors in a broad frequency 
                         range from 0.01 GHz to 2 GHz. The dielectric characterization 
                         consists of measuring the reflection coefficient S11 (real and 
                         imaginary parts) as function of frequency to calculate the 
                         permittivity, impedance and loss tangent of the capacitors tested. 
                         In addition, dielectric chemical composition is determined using 
                         surface X-ray spectroscopy (EDS). The results show that MLCCs have 
                         a resonance frequency higher than 0.3 GHz depending on the value 
                         of their capacitance, making them suitable for use in RF 
                         equipment, mobile phones, radars, and microwave electronic 
                         circuits.",
                  doi = "10.4028/www.scientific.net/AMR.975.61",
                  url = "http://dx.doi.org/10.4028/www.scientific.net/AMR.975.61",
                 isbn = "9783038351436",
                 issn = "1022-6680",
                label = "scopus 2014-11 SilvaNetoRossBarr:2014:ChMuFe",
             language = "en",
        urlaccessdate = "27 abr. 2024"
}